Abstract: The landscape of machine learning evolves rapidly and the complexity of the networks and their architectures defies easy comprehension. AI is touted as the next scientific revolution by allowing the processing and pattern-finding in increasingly massive data sets. One potential end results could be AI enhanced measurement technologies, but what does that mean? This talk will give examples of how classical tools indicate the technical obstacles to this vision in terms of understanding training processes, model comparisons, and feature embeddings. While the results in this talk are largely empirical, they point to interesting directions for (infomation?) theoretical investigation.
Bio: Anand D. Sarwate is an Associate Professor in the Electrical and Computer Engineering Department at Rutgers, The State University of New Jersey. He received B.S. degrees in math and electrical engineering from MIT and a Ph.D. in electrical engineering from UC Berkeley. Prior to joining Rutgers he was a Research Assistant Professor at TTI-Chicago and a postdoc at the ITA Center at UC San Diego. His research interests include information theory, machine learning, signal processing, optimization, and privacy and security.
Location: Light Engineering 250